˜_•¶¥‰ðà

(2009)

1.         S.Kawahito,gRecent progress of CMOS imaging devices,h The 16th International Display Workshops(CD-R), INP1-1,Miyazaki,Dec.2009(Invited)

2.         M.A.Mustafa, S. Itoh, S. Kawahito,gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,h Journal of Automation, Mobile, Robotics & Intelligent Systems, Vol.3, No.4, pp.202-203,2009

3.         S. Shafie, S. Kawahito, I. A. Halin, W. Z. W. Hasan, gNon-linearity in wide dynamic range CMOS image sensors utilizing a partial charge transfer technique,h Sensors2009,vol.9,no.12,pp.9452-9467, Dec.2009

4.         J. H. Park, S. Aoyama, T. Watanabe, K. Isobe, S. Kawahito, gA high-speed low noise CMOS image sensor with 13-b column-parallel single-ended cyclic ADCs,h IEEE Trans. on Electron Devices, vol.56,no.11, pp.2414-2422,Nov.2009

5.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito,gA range-shift technique for TOF range image sensors,h IEEJ Trans. on Sensors and Micromachines, vol.129, no.11,Sec.E, pp.421-425, Nov.2009

6.         M. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, gA CMOS imager and 2-D light pulse receiver array for spatial optical communication,h IEEE Asian Solid-State Circuits Conference(CD-R),pp.113-116,Taipei, Nov.2009

7.         S. Kawahito, gRecent progress of CMOS image sensors,h The 11th Takayanagi Kenjiro Memorial Symposium,program,Hamamatsu,Nov.2009

8.         K. Yasutomi, T. Tamura, M. Furuta, S. Itoh, S. Kawahito,gA high-speed CMOS image sensor with global electronic shutter pixels using pinned diodes,h IEEJ Trans. on Sensors and Micromachines, vol.129, no.10, pp.321-327,Oct.2009

9.         S. W. Jun, K. Yasutomi, S. Itoh, S. Kawahito,gLinearized settling error calibration for a pipeline A/D converter using non-slewing amplifiers,h Inter-Academia2009, vol.3,no.4, pp.204-206, Kazimierz,Sep.2009

10.     M. A. B. Mustafa, S. Itoh, S. Kawahito, gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,hInter-Academia2009, vol.3,no.4, pp.202-203,Kazimierz,Sep.2009

11.     ìlË“ñ,‚Ó‚§[‚©‚·,gî•ñƒZƒ“ƒVƒ“ƒO‚ÆŽY‹Æ˜AŒgh,‰f‘œî•ñƒƒfƒBƒAŠw‰ïŽ,vol.63,no.8,Šª“ªƒy[ƒW,2009.8

12.     ìlË“ñ,Œ¤‹†Žº‚¾‚æ‚è,ɪ‘åŠw“dŽqHŠwŒ¤‹†ŠƒCƒ[ƒWƒ“ƒOƒfƒoƒCƒX•ª–ì,“d‹CŠw‰ï˜_•¶Ž‚dCƒZƒ“ƒTƒ}ƒCƒNƒƒ}ƒVƒ“•”–åŽvol..129 ,no.8,pp.272,2009.8

13.     K. Yasutomi, S. Itoh, S. Kawahito, T. Tamura,gTwo-stage charge transfer pixel using pinned diodes for low-noise global shutter imaging,h Int. Image Sensor w/s,pp.333-336, Bergen,Jun.2009

14.     S. Kawahito, S. Suh, T. Shirei, S. Ito, gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,hInt. Image Sensor w/s, Bergen, pp.320-323, Jun.2009

15.     T. Watanabe, J. H. Park, S. Aoyama, K. Isobe, S. Kawahito,gEffects of negative bias operation and optical stress on dark current,hInt. Image Sensor w/s, pp. 107-110,Bergen,Jun.2009(poster)

16.     S.Suh, S.Itoh, S.Kawahito, T.Shirei, S.Aoyama, C.Nishimura,gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,hEOS Conferences 2009(CD-R), pp15, Munich,Jun.2009

17.     ìlË“ñ,@Œ¤‹†ŽºÐ‰îg‚‘¬‚•ª‰ð”\A/D•ÏŠ·Ší‚Ì’á“d—ÍÝŒv‹Zp‚ÉŠÖ‚·‚錤‹†,h”¼“±‘ÌÝŒvÅ‘Oü2009@–¢—ˆ‚ðØ‚è‘ñ‚­”¼“±‘Ì‹Zp@“úŒoƒ}ƒCƒNƒƒfƒoƒCƒX“Á•Ê•ÒW”Å,@pp.84-85,2009

18.     S. Kawahito, gCMOS Image Sensors Building Blocks,h UPM, Selangor, Malaysia, Mar.2009.(Invited)

19.     H. J. Yoon, S. Itoh, S. Kawahito, gA CMOS Image Sensor with In-Pixel Two-Stage Charge Transfer for Fluorescence Lifetime Imaging,h IEEE Trans. Electron Devices, vol.56,no.2, pp.214-221, Feb.2009.

20.     A. Matsuzawa, G. Gielen, M. Hershenson, S. Kawahito, S. Dosho, gHow to design the future mixed signal LSI's,h Proc. SASIMI2009, p.485, Okinawa, Mar.2009. (Invited, Panel discussion)

21.     J. H. Park, S. Aoyama, T. Watanabe, T. Akahori, T. Kosugi, K. Isobe, Y. Kaneko, Z. Liu, K. Muramatsu, T. Matsuyama, S. Kawahito, gA 0.1e -Vertical FPN 4.7e- Read Noise 71dB DR CMOS Image Sensor with 13b Column-Parallel Single-Ended Cyclic ADCs,h 2009 IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, 15-3, pp.268-269, San Francisco, Feb.2009.

22.     Md. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, gA CMOS Active Pixel Sensor for Optical Communication,h IS&T Electronic Imaging Science and Tech., 7249-21, San Jose, Jan.2009.

23.     K. Yasutomi, T. Tamura, M. Furuta, S. Kawahito, S. Ito, S. Kawahito, gA global electronic shutter pixel using pinned diodes fabricated in standard CMOS-image sensor technology,h IS&T Electronic Imaging Science and Tech., 7249-14, San Jose, Jan.2009.

 

‘“àŒû“ª”­•\

(2009)

1.      ìlË“ñ, gCMOS‹@”\WσZƒ“ƒT,h IEEE–¼ŒÃ‰®Žx•” ‘‰ïFellow ŽóÜ‹L”Ou‰‰‰ï, –¼ŒÃ‰®, 2009.12.19

2.      à_ˆä”R‘¾,ˆÉ“¡^–ç,Md. Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,‚ˆä@—E,ˆÀ“¡“¹‘¥,ìlË“ñ, gŽÔŽÔŠÔE˜HŽÔŠÔŒõ’ÊM—pCMOSƒCƒ[ƒWƒZƒ“ƒT‚ÆLEDŒõŒ¹‚ð—p‚¢‚½’ÊM‹——£‚Ì•]‰¿ŽÀŒ±,h“dŽqî•ñ’ÊMŠw‰ïWωñ˜HŒ¤‹†‰ï12ŒŽŒ¤‹†‰ïŠw¶EŽáŽèŒ¤‹†‰ï,•l¼, 2009.12.14(ƒ|ƒXƒ^[)

3.      ÂŽR‘,–pßá©,“n•Ó‹±Žu,ìlË“ñ, gƒCƒ[ƒWƒZƒ“ƒT@` ‚»‚Ì–£—Í‚ÆÝŒv‚̓‚³ `,h “dŽqî•ñ’ÊMŠw‰ïWωñ˜HŒ¤‹†‰ï12ŒŽŒ¤‹†‰ïŠw¶EŽáŽèŒ¤‹†‰ï,•l¼, 2009.12.14(µ‘Òu‰‰)

4.      ‚ˆä—E,‘¾“c[•F,–Ø‘ºDŽ,ˆÀ“¡“¹‘¥,Md.Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,à_ˆä”R‘¾,ˆÉ“¡^–ç,ìlË“ñ, gƒCƒ[ƒWƒZƒ“ƒT‚É‚æ‚éŽÔŽÔE˜HŽÔŠÔ’ÊM‚Ì‚½‚ß‚ÌŒõ‹óŠÔ’ÊMƒVƒXƒeƒ€,hViEW2009,‰¡•l,2009.12.3

5.      ìlË“ñ, g‹@”\WσCƒ[ƒWƒ“ƒOƒfƒoƒCƒX‚Ɖ摜ƒZƒ“ƒVƒ“ƒO‚ւ̉ž—p,h ŽO•H“d‹@æ’[‹Zp‘‡Œ¤‹†Š,•ºŒÉ,2009.11.24(µ‘Òu‰‰)                                                                               

6.      ìlË“ñ, gŽžŠÔ•ª‰ðŽB‘œƒfƒoƒCƒX‹Zp‚Ɖž—p- ‹É’ZŽžŠÔ‰ž“šƒsƒNƒZƒ‹‚ð—p‚¢‚½Œõ”òsŽžŠÔŒ^ƒŒƒ“ƒWƒtƒ@ƒCƒ“ƒ_AŒuŒõŽõ–½‚É’…–Ú‚µ‚½ƒoƒCƒIƒCƒ[ƒWƒ“ƒO‚ւ̉ž—p,h, JSTInnovation Bridge ɪ‘åŠwŒ¤‹†ƒV[ƒY”­•\‰ï,“Œ‹ž,2009.10.19

7.      Z. Li,H.J. Yoon,S. Itoh,S.Kawahito, gTime domain fluorescence lifetime image sensor using two-stage charge transfer pixels with pinned diode,h ‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï@Wωñ˜HŒ¤‹†‰ï,“Œ‹ž, 2009.10.1

8.      ’|‰º—TÍE”Ñ“c“N–çEˆÀ•xŒ[‘¾EìlË“ñ, g–„‚ßž‚ÝŒ^‚‘¬“d‰×“]‘—ƒtƒHƒgƒ_ƒCƒI[ƒh‚ð—p‚¢‚½TOF‹——£‰æ‘œƒZƒ“ƒT‚ÌŽŽì,h‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ïWωñ˜HŒ¤‹†‰ï,“Œ‹ž, 2009.10.1

9.      “n•Ó‹±Žu, –pßá©,ÂŽR‘,ˆé•”Œ\Œá,ìlË“ñ, gCMOSƒCƒ[ƒWƒZƒ“ƒT‚̈Ód—¬‚ɑ΂·‚镉“dˆ³‹ì“®‚¨‚æ‚ÑŒõƒXƒgƒŒƒX‚ÌŒø‰Ê,h‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ïiISTj,“Œ‹ž, 2009.9.28

10.   S. Suh,S. Itoh,T. Iida,S. Kawahito, gNoise reduction effects of column-parallel multiple sampling circuits,h‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ïiISTj,“Œ‹ž, 2009.9.28

11.   ìlË“ñ, gCMOSƒCƒ[ƒWƒZƒ“ƒT‚Ì‹Zp“®Œü,h“dŽqƒWƒƒ[ƒiƒ‹‘æ216‰ñTechnical Symposium,2009HCCD/CMOSƒCƒ[ƒWƒZƒ“ƒT“O’ꌟØ,“Œ‹ž, 2009.9.25(µ‘Òu‰‰)

12.   ìlË“ñ, g’´‚Š´“x”ñ—â‹pCMOSƒCƒ[ƒWƒZƒ“ƒTh, gŽÔÚ—p‚‹@”\‰æ‘œƒZƒ“ƒT‚ÌŠJ”­,h•l¼E“ŒŽO‰Í’nˆæ’m“IƒNƒ‰ƒXƒ^[‘n¬Ž–‹Æi‘æ2Šúj’†ŠÔ¬‰Ê”­•\‰ï,•l¼,2009.9.3

13.   ¬Ý,ˆÉ“¡^–ç,ìlË“ñ,Žu—ç‘ñ–CÂŽR‘C¼‘º’qŒb, g‘ŠŠÖ‘½dƒTƒ“ƒvƒŠƒ“ƒO–@‚ð—p‚¢‚½’áƒmƒCƒYƒCƒ[ƒWƒZƒ“ƒT,h2009”N‰f‘œî•ñƒƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

14.   ˆÉ“¡^–ç,Md. Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,ìlË“ñ,‚ˆä@—E,ˆÀ“¡“¹‘¥, gŽÔŽÔŠÔE˜HŽÔŠÔŒõ’ÊMƒVƒXƒeƒ€—pCMOSƒCƒ[ƒWƒZƒ“ƒT,h2009”N‰f‘œî•ñƒƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

15.   ”Ñ“c“N–ç,ìlË“ñ,ˆÉ“¡^–ç, g‘½’iŠKŒXŽÎƒŠƒZƒbƒg“®ì‚É‚æ‚éƒmƒCƒY’ጸŒø‰Ê,h2009”N‰f‘œî•ñƒƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

16.   ìlË“ñ, g‚‘¬‚•ª‰ð”\A/D•ÏŠ·Ší‚Ì’á“d—ÍÝŒv‹Zp‚ÉŠÖ‚·‚錤‹†,hi‹¤“¯Œ¤‹†¬‰ÊЉîj, STARC‹ZpˆÚ“]Žx‰‡ƒZƒ~ƒi[,‰¡•l, 2009.8.18

17.   ìlË“ñ, gƒAƒiƒƒOLSI ‚Ì‹Zp“®Œü,hICDƒTƒ}[ƒXƒN[ƒ‹2009,”MŠC, 2009.8.4iµ‘Òu‰‰j

18.   ˆÀ•xŒ[‘¾,“c‘ºr”Ž,ˆÉ“¡^–ç,ìlË“ñ, g–„‚ßž‚݃_ƒCƒI[ƒh‚ð—p‚¢‚½‚Q’i“d‰×“]‘—Œ^’áŽG‰¹“dŽqƒVƒƒƒbƒ^,h‰f‘œî•ñƒƒfƒBƒAŠw‰ï‹Zp•ñ@î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï@‚VŒŽŒ¤‹†‰ï,IST2009-43, Vol.33,No30, pp13-16,“Œ‹ž,2009.7.24

19.   ìlË“ñ, g‚b‚l‚n‚rƒCƒ[ƒWƒZƒ“ƒT‚ÌÅV‹Zp“®Œü,hƒAƒhƒoƒ“ƒeƒXƒgƒAƒJƒfƒ~[,ŒQ”n,2009.7.8iµ‘Òu‰‰j

20.   ìlË“ñ, g’´’áÁ”ï“d—Í‚‘¬A/D•ÏŠ·Ší‚ðŽÀŒ»‚·‚éƒfƒWƒ^ƒ‹ƒAƒVƒXƒg‹Zp‚ÉŠÖ‚·‚錤‹†,hSTARCŒ¤‹†Œv‰æà–¾‰ï, ‰¡•l,2009.6.1

21.   –pßá©,ÂŽR‘,“n•Ó‹±Žu,Ô–x’ms,¬™’q•F,ˆé•”Œ\ŒáA‹àŽq—Tˆê,—«³,¼ŽR•,ìlË“ñ, g‚P‚R‚‚ƒVƒ“ƒOƒ‹ƒGƒ“ƒhŒ^ƒTƒCƒNƒŠƒbƒNADC‚ð—p‚¢‚½‚‘¬’áƒmƒCƒYCMOSƒCƒ[ƒWƒZƒ“ƒT‚ÌŠJ”­,hLSI‚ƃVƒXƒeƒ€‚̃[ƒNƒVƒ‡ƒbƒv2009,–k‹ãB,@2009.5.19

22.   ‘S¬ú¹, ˆÀ•xŒ[‘¾, ˆÉ“¡^–ç, ìlË“ñ, gLinearized settling error calibration for a pipeline A/D converter using non-slewimg amplifiers,h LSI‚ƃVƒXƒeƒ€‚̃[ƒNƒVƒ‡ƒbƒv2009,–k‹ãB,@2009.5.19

23.   ’|‰º—TÍ, ìlË“ñ, g“d‰×”ro‹@”\‚ð—L‚·‚é–„‚ßž‚ÝŒ^‚‘¬“d‰×“]‘—ƒtƒHƒgƒ_ƒCƒI[ƒh\‘¢‚ÌŒŸ“¢,h@LSI‚ƃVƒXƒeƒ€‚̃[ƒNƒVƒ‡ƒbƒv2009,–k‹ãB, 2009.5.19

24.   ìlË“ñ, gŽÔŽÔŠÔA˜HŽÔŠÔ‚̃Cƒ[ƒWƒZƒ“ƒT’ÊM,h‰ÂŽ‹Œõ’ÊMƒRƒ“ƒ\[ƒVƒAƒ€,“Œ‹ž,2009.4.28

25.   ìlË“ñ, gƒpƒCƒvƒ‰ƒCƒ“AD•ÏŠ·Ší‚̃fƒWƒ^ƒ‹ƒAƒVƒXƒg‹Zp,h‘æ22‰ñ‰ñ˜H‚ƃVƒXƒeƒ€Œyˆä‘òƒ[ƒNƒVƒ‡ƒbƒv, Ba1-3-2,Œyˆä‘ò,2009.4.20(invited)

26.   ìlË“ñ, g‚‘¬’áƒmƒCƒYLƒ_ƒCƒiƒ~ƒbƒNƒŒƒ“ƒWƒJƒ‰ƒ€Œ^A/D•ÏŠ·Ší‚Æ‚±‚ê‚ð—p‚¢‚½CMOSƒCƒ[ƒWƒZƒ“ƒT,hŽŸ¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“¥ƒVƒXƒeƒ€•”‰ï‘æ124‰ñ’è—á‰ï,“Œ‹ž,2009.4.10i”­•\‘ã—j

27.   J. H. Park, S. Aoyama, T. Watanabe, T. Akahori, T. Kosugi, K. Isobe, Y. Kaneko, Z. Liu, K. Muramatsu, T. Matsuyama, S. Kawahito, gA High-Speed Low-Noise CMOS Image Sensor with 13b Column-Parakkek Single-Ended Cyclic ADCs,h ‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï3ŒŽŒ¤‹†‰ï, IST2009-14, “Œ‹ž, 2009.3.

28.   ˆÉ“¡^–ç, MD. S. Z. Sarker, ˆÀ•xŒ[‘¾, ‰ªŒ©_Ž¡, ‚ˆä—E, ˆÀ“¡“¹‘¥, ìlË“ñ, gŽÔŽÔŠÔ¥˜HŽÔŠÔŒõ’ÊMƒVƒXƒeƒ€‚Ö‚ÌCMOSƒCƒ[ƒWƒZƒ“ƒT‹Zp‚̉ž—p‚ÆŒõŽóM‰æ‘f‰ñ˜H‚Ì“Á«•]‰¿h, ‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï3ŒŽŒ¤‹†‰ï, IST2009-16, “Œ‹ž, 2009.3.

29.   ìlË“ñ, g’´‚Š´“x”ñ—â‹p‚b‚l‚n‚rƒCƒ[ƒWƒZƒ“ƒT,hƒIƒvƒgƒƒjƒNƒXƒtƒH[ƒ‰ƒ€2009in•l¼, •l¼, 2009.3. (Œ¤‹†¬‰Ê”­•\)

30.   A. Matsuzawa, G. Gielen, M. Hershenson, S. Kawahito, S. Dosho, gHow to design the future mixed signal LSI's,h SASIMI2009, Okinawa, 2009.3. (Invited, Panel discussion)

31.   ìlË“ñ, gƒfƒWƒ^ƒ‹ƒCƒ[ƒWƒZƒ“ƒT‚Ì‹Zp“®Œüh, ŽŸ¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“ƒVƒXƒeƒ€•”‰ï‘æ123‰ñ’è—á‰ï, “Œ‹ž, 2009.1.

32.   ìlË“ñ, ¬ìhˆê, gŽŸ¢‘ãƒfƒWƒ^ƒ‹ƒJƒƒ‰‚ƃCƒ[ƒWƒZƒ“ƒT,hŽŸ¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“ƒVƒXƒeƒ€•”‰ï‘æ123‰ñ’è—á‰ï, “Œ‹ž, 2009.1. (ƒpƒlƒ‹“¢˜_)